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Malkina, SD, Malkin, AI & Korotkov, AN 2022,
Permittivity Measurement Technique for Solid and Powder Materials. в
Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM, Том. 2022-June, IEEE Computer Society, стр. 84-87, 23rd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2022, Altai, Российская Федерация,
30/06/2022.
https://doi.org/10.1109/EDM55285.2022.9855182
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@inproceedings{9b3ae45740d14ce99681d8d21325b016,
title = "Permittivity Measurement Technique for Solid and Powder Materials",
keywords = "NRW, open-ended coaxial probe, permittivity, powder material, solid material, transmission line, vector network analyzer",
author = "Malkina, {Sofia D.} and Malkin, {Alexander I.} and Korotkov, {Alexey N.}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 23rd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2022 ; Conference date: 30-06-2022 Through 04-07-2022",
year = "2022",
doi = "10.1109/EDM55285.2022.9855182",
language = "English",
series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
publisher = "IEEE Computer Society",
pages = "84--87",
booktitle = "Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022",
address = "United States",
}
RIS
TY - GEN
T1 - Permittivity Measurement Technique for Solid and Powder Materials
AU - Malkina, Sofia D.
AU - Malkin, Alexander I.
AU - Korotkov, Alexey N.
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
KW - NRW
KW - open-ended coaxial probe
KW - permittivity
KW - powder material
KW - solid material
KW - transmission line
KW - vector network analyzer
UR - http://www.scopus.com/inward/record.url?scp=85137322344&partnerID=8YFLogxK
U2 - 10.1109/EDM55285.2022.9855182
DO - 10.1109/EDM55285.2022.9855182
M3 - Conference contribution
AN - SCOPUS:85137322344
T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
SP - 84
EP - 87
BT - Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022
PB - IEEE Computer Society
T2 - 23rd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2022
Y2 - 30 June 2022 through 4 July 2022
ER -