Permittivity Measurement Technique for Solid and Powder Materials

Standard

Permittivity Measurement Technique for Solid and Powder Materials. / Malkina, Sofia D.; Malkin, Alexander I.; Korotkov, Alexey N.
Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022. IEEE Computer Society, 2022. p. 84-87 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; Vol. 2022-June).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Harvard

Malkina, SD , Malkin, AI & Korotkov, AN 2022, Permittivity Measurement Technique for Solid and Powder Materials. in Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM, vol. 2022-June, IEEE Computer Society, pp. 84-87, 23rd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2022, Altai, Russian Federation, 30/06/2022. https://doi.org/10.1109/EDM55285.2022.9855182

APA

Malkina, S. D., Malkin, A. I., & Korotkov, A. N. (2022). Permittivity Measurement Technique for Solid and Powder Materials. In Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022 (pp. 84-87). (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; Vol. 2022-June). IEEE Computer Society. https://doi.org/10.1109/EDM55285.2022.9855182

Vancouver

Malkina SD , Malkin AI , Korotkov AN. Permittivity Measurement Technique for Solid and Powder Materials. In Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022. IEEE Computer Society. 2022. p. 84-87. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). doi: 10.1109/EDM55285.2022.9855182

Author

Malkina, Sofia D. ; Malkin, Alexander I. ; Korotkov, Alexey N. / Permittivity Measurement Technique for Solid and Powder Materials. Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022. IEEE Computer Society, 2022. pp. 84-87 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

BibTeX

@inproceedings{9b3ae45740d14ce99681d8d21325b016,

title = "Permittivity Measurement Technique for Solid and Powder Materials",

keywords = "NRW, open-ended coaxial probe, permittivity, powder material, solid material, transmission line, vector network analyzer",

author = "Malkina, {Sofia D.} and Malkin, {Alexander I.} and Korotkov, {Alexey N.}",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 23rd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2022 ; Conference date: 30-06-2022 Through 04-07-2022",

year = "2022",

doi = "10.1109/EDM55285.2022.9855182",

language = "English",

series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",

publisher = "IEEE Computer Society",

pages = "84--87",

booktitle = "Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022",

address = "United States",

}

RIS

TY - GEN

T1 - Permittivity Measurement Technique for Solid and Powder Materials

AU - Malkina, Sofia D.

AU - Malkin, Alexander I.

AU - Korotkov, Alexey N.

PY - 2022

Y1 - 2022

KW - NRW

KW - open-ended coaxial probe

KW - permittivity

KW - powder material

KW - solid material

KW - transmission line

KW - vector network analyzer

UR - http://www.scopus.com/inward/record.url?scp=85137322344&partnerID=8YFLogxK

U2 - 10.1109/EDM55285.2022.9855182

DO - 10.1109/EDM55285.2022.9855182

M3 - Conference contribution

AN - SCOPUS:85137322344

T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

SP - 84

EP - 87

BT - Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022

PB - IEEE Computer Society

T2 - 23rd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2022

Y2 - 30 June 2022 through 4 July 2022

ER -

ID: 30894028