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Local atomic configurations, energy structure, and optical properties of implantation defects in Gd-doped silica glass: An XPS, PL, and DFT study
Research output
:
Contribution to journal
›
Article
›
peer-review
Department of Physical Techniques and Devices for Quality Control
Department of Theoretical Physics and Applied Mathematics
Department of Condensed Matter Physics and Nanoscale Systems
Section of Optoelectronics and Semiconductor Technology
Institute of Physics and Technology
Institute of Natural Sciences and Mathematics
Overview
Cite this
DOI
https://doi.org/10.1016/j.jallcom.2019.04.303
Final published version
A. F. Zatsepin
D. A. Zatsepin
D. W. Boukhvalov
Yu A. Kuznetsova
N. V. Gavrilov
V. Ya Shur
A. A. Esin
Original language
English
Pages (from-to)
77-85
Number of pages
9
Journal
Journal of Alloys and Compounds
Volume
796
DOIs
https://doi.org/10.1016/j.jallcom.2019.04.303
Publication status
Published -
5 Aug 2019
ASJC Scopus subject areas
Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry
Research areas
DFT, Gadolininia, Implantation, Impurities, Oxides, Photoluminescence, Silica, MATRIX, LUMINESCENCE, ION-IMPLANTATION, PHOTOEMISSION, AMORPHOUS SIO2
WoS ResearchAreas Categories
Chemistry, Physical
Materials Science, Multidisciplinary
Metallurgy & Metallurgical Engineering
ID: 9814062
