Bi-doped silica glass: A combined XPS – DFT study of electronic structure and pleomorphic imperfections

Original language	English
Article number	154459
Number of pages	8
Journal	Journal of Alloys and Compounds
Volume	829
DOIs	https://doi.org/10.1016/j.jallcom.2020.154459
Publication status	Published - 15 Jul 2020

Bismuth, DFT, Gap engineering, Impurities, Nonstoichiometric defects, Phoemission, Silica, THIN-FILMS, BISMUTH OXIDES, OPTICAL-PROPERTIES, MODEL, BULK, IMPLANTATION

ID: 12417785