A comparative analysis of magnetic hysteresis loops measured by a vibrating sample magnetometer, a magnetic measuring complex with SQUID-based primary transducer (SQUID-magnetometer), and magneto-optical Kerr-microscope has been performed on the multilayered film structure Cu / [FeNi / Cu] 10 deposited by the ion-plasma sputtering. Measurements made with the SQUID-magnetometer allowed one to detect the stepped nature of magnetization reversal of the film structure. The presence of the stepped nature was confirmed by observations on a Kerr-microscope in a quasistatic magnetization reversal mode.