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Thin bismuth film study by means of transmission electron microscopy. / Kolosov, V. Yu; Yushkov, A. A.; Bokuniaeva, A. O.
Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. Том 2015 American Institute of Physics Inc., 2018. 020042.

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Harvard

Kolosov, VY, Yushkov, AA & Bokuniaeva, AO 2018, Thin bismuth film study by means of transmission electron microscopy. в Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. Том. 2015, 020042, American Institute of Physics Inc., 5th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2018, Ekaterinburg, Российская Федерация, 13/05/2018. https://doi.org/10.1063/1.5055115

APA

Kolosov, V. Y., Yushkov, A. A., & Bokuniaeva, A. O. (2018). Thin bismuth film study by means of transmission electron microscopy. в Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference (Том 2015). [020042] American Institute of Physics Inc.. https://doi.org/10.1063/1.5055115

Vancouver

Kolosov VY, Yushkov AA, Bokuniaeva AO. Thin bismuth film study by means of transmission electron microscopy. в Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. Том 2015. American Institute of Physics Inc. 2018. 020042 doi: 10.1063/1.5055115

Author

Kolosov, V. Yu ; Yushkov, A. A. ; Bokuniaeva, A. O. / Thin bismuth film study by means of transmission electron microscopy. Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. Том 2015 American Institute of Physics Inc., 2018.

BibTeX

@inproceedings{3279ab924ead465488b9b1e3afe33096,
title = "Thin bismuth film study by means of transmission electron microscopy",
author = "Kolosov, {V. Yu} and Yushkov, {A. A.} and Bokuniaeva, {A. O.}",
year = "2018",
month = sep,
day = "25",
doi = "10.1063/1.5055115",
language = "English",
isbn = "9780735417335",
volume = "2015",
booktitle = "Physics, Technologies and Innovation, PTI 2018",
publisher = "American Institute of Physics Inc.",
address = "United States",
note = "5th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2018 ; Conference date: 13-05-2018 Through 17-05-2018",

}

RIS

TY - GEN

T1 - Thin bismuth film study by means of transmission electron microscopy

AU - Kolosov, V. Yu

AU - Yushkov, A. A.

AU - Bokuniaeva, A. O.

PY - 2018/9/25

Y1 - 2018/9/25

UR - http://www.scopus.com/inward/record.url?scp=85054166261&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000481575200042

UR - https://elibrary.ru/item.asp?id=38617341

U2 - 10.1063/1.5055115

DO - 10.1063/1.5055115

M3 - Conference contribution

AN - SCOPUS:85054166261

SN - 9780735417335

VL - 2015

BT - Physics, Technologies and Innovation, PTI 2018

PB - American Institute of Physics Inc.

T2 - 5th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2018

Y2 - 13 May 2018 through 17 May 2018

ER -

ID: 7902611