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The methodology of analysis of technical state assessment of circuit breakers. / Khalyasmaa, Alexandra I.; Senyuk, Mihail D.; Eroshenko, Stanislav A. и др.
Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018. Том 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. стр. 667-671.

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Harvard

Khalyasmaa, AI, Senyuk, MD, Eroshenko, SA & Plyusnina, EI 2018, The methodology of analysis of technical state assessment of circuit breakers. в Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018. Том. 2018-January, Institute of Electrical and Electronics Engineers Inc., стр. 667-671, 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018, St. Petersburg and Moscow, Российская Федерация, 28/01/2018. https://doi.org/10.1109/EIConRus.2018.8317183

APA

Khalyasmaa, A. I., Senyuk, M. D., Eroshenko, S. A., & Plyusnina, E. I. (2018). The methodology of analysis of technical state assessment of circuit breakers. в Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018 (Том 2018-January, стр. 667-671). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EIConRus.2018.8317183

Vancouver

Khalyasmaa AI, Senyuk MD, Eroshenko SA, Plyusnina EI. The methodology of analysis of technical state assessment of circuit breakers. в Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018. Том 2018-January. Institute of Electrical and Electronics Engineers Inc. 2018. стр. 667-671 doi: 10.1109/EIConRus.2018.8317183

Author

Khalyasmaa, Alexandra I. ; Senyuk, Mihail D. ; Eroshenko, Stanislav A. и др. / The methodology of analysis of technical state assessment of circuit breakers. Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018. Том 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. стр. 667-671

BibTeX

@inproceedings{ae8e4ef45c7747a299f5334dc95f7c9b,
title = "The methodology of analysis of technical state assessment of circuit breakers",
keywords = "circuit breakers, diagnostics, short-circuit current, switching devices, testing",
author = "Khalyasmaa, {Alexandra I.} and Senyuk, {Mihail D.} and Eroshenko, {Stanislav A.} and Plyusnina, {Evgenia I.}",
year = "2018",
month = mar,
day = "14",
doi = "10.1109/EIConRus.2018.8317183",
language = "English",
volume = "2018-January",
pages = "667--671",
booktitle = "Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018 ; Conference date: 28-01-2018 Through 31-01-2018",

}

RIS

TY - GEN

T1 - The methodology of analysis of technical state assessment of circuit breakers

AU - Khalyasmaa, Alexandra I.

AU - Senyuk, Mihail D.

AU - Eroshenko, Stanislav A.

AU - Plyusnina, Evgenia I.

PY - 2018/3/14

Y1 - 2018/3/14

KW - circuit breakers

KW - diagnostics

KW - short-circuit current

KW - switching devices

KW - testing

UR - http://www.scopus.com/inward/record.url?scp=85048156379&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000450337100162

UR - https://elibrary.ru/item.asp?id=35734706

U2 - 10.1109/EIConRus.2018.8317183

DO - 10.1109/EIConRus.2018.8317183

M3 - Conference contribution

AN - SCOPUS:85048156379

VL - 2018-January

SP - 667

EP - 671

BT - Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2018

Y2 - 28 January 2018 through 31 January 2018

ER -

ID: 7421758