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Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2. / Zatsepin, D. A.; Boukhvalov, D. W.; Kurmaev, E. Z. и др.
в: Applied Surface Science, Том 379, 30.08.2016, стр. 223-229.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

Harvard

Zatsepin, DA, Boukhvalov, DW, Kurmaev, EZ, Gavrilov, NV, Kim, SS & Zhidkov, IS 2016, 'Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2', Applied Surface Science, Том. 379, стр. 223-229. https://doi.org/10.1016/j.apsusc.2016.04.045

APA

Zatsepin, D. A., Boukhvalov, D. W., Kurmaev, E. Z., Gavrilov, N. V., Kim, S. S., & Zhidkov, I. S. (2016). Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2. Applied Surface Science, 379, 223-229. https://doi.org/10.1016/j.apsusc.2016.04.045

Vancouver

Zatsepin DA, Boukhvalov DW, Kurmaev EZ, Gavrilov NV, Kim SS, Zhidkov IS. Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2. Applied Surface Science. 2016 авг. 30;379:223-229. doi: 10.1016/j.apsusc.2016.04.045

Author

Zatsepin, D. A. ; Boukhvalov, D. W. ; Kurmaev, E. Z. и др. / Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2. в: Applied Surface Science. 2016 ; Том 379. стр. 223-229.

BibTeX

@article{a28fbde13b48419397dbcf6d78512645,
title = "Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2",
keywords = "Aggregation, Bismuth oxide, DFT, Ion implantation, Titanium dioxide",
author = "Zatsepin, {D. A.} and Boukhvalov, {D. W.} and Kurmaev, {E. Z.} and Gavrilov, {N. V.} and Kim, {S. S.} and Zhidkov, {I. S.}",
year = "2016",
month = aug,
day = "30",
doi = "10.1016/j.apsusc.2016.04.045",
language = "English",
volume = "379",
pages = "223--229",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier BV",

}

RIS

TY - JOUR

T1 - Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2

AU - Zatsepin, D. A.

AU - Boukhvalov, D. W.

AU - Kurmaev, E. Z.

AU - Gavrilov, N. V.

AU - Kim, S. S.

AU - Zhidkov, I. S.

PY - 2016/8/30

Y1 - 2016/8/30

KW - Aggregation

KW - Bismuth oxide

KW - DFT

KW - Ion implantation

KW - Titanium dioxide

UR - http://www.scopus.com/inward/record.url?scp=84964330406&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000376819300029

U2 - 10.1016/j.apsusc.2016.04.045

DO - 10.1016/j.apsusc.2016.04.045

M3 - Article

AN - SCOPUS:84964330406

VL - 379

SP - 223

EP - 229

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -

ID: 797211