A method for the separation of X-ray background is suggested. The method is based on the integral digital filtration of experimental diffraction patterns and their "smoothening" and the subsequent combination of the smoothened and initial diffraction patterns. The combined diffraction pattern thus obtained is smoothened again, and the whole procedure is repeated anew. The criterion for concluding the iteration procedure (background criterion) is suggested to be the attainment of the situation where a certain percent of the points of the initial diffraction pattern would be below the background line determined. It is shown that, in some instances, the method yields more appropriate results than the traditional methods. The application of the new method is not limited by X-ray diffraction alone. (C) 2005 Pleiades Publishing, Inc.