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Harvard
Shur, VY, Rumyantsev, EL, Nikolaeva, EV, Shishkin, EI, Batchko, RG, Miller, GD, Fejer, MM & Byer, RL 2000, '
Micro- and nanoscale domain engineering in lithium niobate and lithium tantalate',
Proceedings of SPIE - The International Society for Optical Engineering, Том. 3992, стр. 143-154.
https://doi.org/10.1117/12.388198
APA
Shur, V. Y., Rumyantsev, E. L., Nikolaeva, E. V., Shishkin, E. I., Batchko, R. G., Miller, G. D., Fejer, M. M., & Byer, R. L. (2000).
Micro- and nanoscale domain engineering in lithium niobate and lithium tantalate.
Proceedings of SPIE - The International Society for Optical Engineering,
3992, 143-154.
https://doi.org/10.1117/12.388198
Vancouver
Author
BibTeX
@article{d6a54bd18dbd44ca80337443532d8259,
title = "Micro- and nanoscale domain engineering in lithium niobate and lithium tantalate",
author = "Shur, {V. Ya.} and Rumyantsev, {E. L.} and Nikolaeva, {E. V.} and Shishkin, {E. I.} and Batchko, {R. G.} and Miller, {G. D.} and Fejer, {M. M.} and Byer, {R. L.}",
year = "2000",
month = jan,
day = "1",
doi = "10.1117/12.388198",
language = "English",
volume = "3992",
pages = "143--154",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "Society of Photo-optical Instrumentation Engineers",
}
RIS
TY - JOUR
T1 - Micro- and nanoscale domain engineering in lithium niobate and lithium tantalate
AU - Shur, V. Ya.
AU - Rumyantsev, E. L.
AU - Nikolaeva, E. V.
AU - Shishkin, E. I.
AU - Batchko, R. G.
AU - Miller, G. D.
AU - Fejer, M. M.
AU - Byer, R. L.
PY - 2000/1/1
Y1 - 2000/1/1
UR - http://www.scopus.com/inward/record.url?scp=0033685606&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000088918100014
U2 - 10.1117/12.388198
DO - 10.1117/12.388198
M3 - Conference article
AN - SCOPUS:0033685606
VL - 3992
SP - 143
EP - 154
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
ER -