Standard

Influence of Ce0.8R0.2O2-a (R = Y, Sm, Tb) submicron barrier layers at the La2NiO4+delta/YSZ boundary on the electrochemical performance of a cathode. / Kovrova, A. I.; Gorelov, V. P.; Kuzmin, A. V. и др.
в: Journal of Solid State Electrochemistry, Том 25, № 6, 06.2021, стр. 1789-1796.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

Harvard

Kovrova, AI, Gorelov, VP, Kuzmin, AV, Tropin, ES & Osinkin, DA 2021, 'Influence of Ce0.8R0.2O2-a (R = Y, Sm, Tb) submicron barrier layers at the La2NiO4+delta/YSZ boundary on the electrochemical performance of a cathode', Journal of Solid State Electrochemistry, Том. 25, № 6, стр. 1789-1796. https://doi.org/10.1007/s10008-021-04942-w

APA

Kovrova, A. I., Gorelov, V. P., Kuzmin, A. V., Tropin, E. S., & Osinkin, D. A. (2021). Influence of Ce0.8R0.2O2-a (R = Y, Sm, Tb) submicron barrier layers at the La2NiO4+delta/YSZ boundary on the electrochemical performance of a cathode. Journal of Solid State Electrochemistry, 25(6), 1789-1796. https://doi.org/10.1007/s10008-021-04942-w

Vancouver

Kovrova AI, Gorelov VP, Kuzmin AV, Tropin ES, Osinkin DA. Influence of Ce0.8R0.2O2-a (R = Y, Sm, Tb) submicron barrier layers at the La2NiO4+delta/YSZ boundary on the electrochemical performance of a cathode. Journal of Solid State Electrochemistry. 2021 июнь;25(6):1789-1796. doi: 10.1007/s10008-021-04942-w

Author

Kovrova, A. I. ; Gorelov, V. P. ; Kuzmin, A. V. и др. / Influence of Ce0.8R0.2O2-a (R = Y, Sm, Tb) submicron barrier layers at the La2NiO4+delta/YSZ boundary on the electrochemical performance of a cathode. в: Journal of Solid State Electrochemistry. 2021 ; Том 25, № 6. стр. 1789-1796.

BibTeX

@article{6f312d9a242f48a48b74b280faf4aca2,
title = "Influence of Ce0.8R0.2O2-a (R = Y, Sm, Tb) submicron barrier layers at the La2NiO4+delta/YSZ boundary on the electrochemical performance of a cathode",
keywords = "SOFC, Cathode La2NiO4, CeO2 barrier films, YSZ electrolyte, Polarization resistance, DRT, Cathode La NiO, CeO barrier films",
author = "Kovrova, {A. I.} and Gorelov, {V. P.} and Kuzmin, {A. V.} and Tropin, {E. S.} and Osinkin, {D. A.}",
year = "2021",
month = jun,
doi = "10.1007/s10008-021-04942-w",
language = "English",
volume = "25",
pages = "1789--1796",
journal = "Journal of Solid State Electrochemistry",
issn = "1432-8488",
publisher = "Springer Verlag",
number = "6",

}

RIS

TY - JOUR

T1 - Influence of Ce0.8R0.2O2-a (R = Y, Sm, Tb) submicron barrier layers at the La2NiO4+delta/YSZ boundary on the electrochemical performance of a cathode

AU - Kovrova, A. I.

AU - Gorelov, V. P.

AU - Kuzmin, A. V.

AU - Tropin, E. S.

AU - Osinkin, D. A.

PY - 2021/6

Y1 - 2021/6

KW - SOFC

KW - Cathode La2NiO4

KW - CeO2 barrier films

KW - YSZ electrolyte

KW - Polarization resistance

KW - DRT

KW - Cathode La NiO

KW - CeO barrier films

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000640149200002

UR - http://www.scopus.com/inward/record.url?scp=85104311186&partnerID=8YFLogxK

UR - https://elibrary.ru/item.asp?id=46770585

U2 - 10.1007/s10008-021-04942-w

DO - 10.1007/s10008-021-04942-w

M3 - Article

VL - 25

SP - 1789

EP - 1796

JO - Journal of Solid State Electrochemistry

JF - Journal of Solid State Electrochemistry

SN - 1432-8488

IS - 6

ER -

ID: 21887209