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Forward growth and formation of 1D domain arrays by focused ion beam in Y-cut MgOLN. / Pashnina, E. A.; Chezganov, D. S.; Slautina, A. S. и др.
в: Ferroelectrics, Том 604, № 1, 2023, стр. 53-61.

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@article{41e963c549be41928b777bbeaea63c62,
title = "Forward growth and formation of 1D domain arrays by focused ion beam in Y-cut MgOLN",
abstract = "The ion beam-induced domain growth in Y-cut MgO-doped lithium niobate (MgOLN) covered by the resist layer was studied. A comparative study of domain structure in the samples with and without surface dielectric layer is crucial for periodical poling. Differences in the domain shape with changes in the irradiation dose, energy, and current of the ion beam were revealed. The maximum domain depth was 400 nm at 100 pC. A detailed analysis of interaction for different distance between irradiated dots in row revealed formation of 1 D arrays with variating length of the wedge-like domains. These findings allow optimizing the poling process. {\textcopyright} 2023 Taylor & Francis Group, LLC.",
author = "Pashnina, {E. A.} and Chezganov, {D. S.} and Slautina, {A. S.} and Turygin, {A. P.} and Shur, {V. Ya.}",
note = "The research was made possible by Russian Science Foundation (project no. 19-12-00210), https://rscf.ru/project/19-12-00210/. The equipment of the Ural Center for Shared Use “Modern nanotechnology” Ural Federal University (reg. no. 2968), which is supported by the Ministry of Science and Higher Education RF (project no. 075-15-2021-677) was used.",
year = "2023",
doi = "10.1080/00150193.2023.2168980",
language = "English",
volume = "604",
pages = "53--61",
journal = "Ferroelectrics",
issn = "0015-0193",
publisher = "Taylor and Francis Ltd.",
number = "1",

}

RIS

TY - JOUR

T1 - Forward growth and formation of 1D domain arrays by focused ion beam in Y-cut MgOLN

AU - Pashnina, E. A.

AU - Chezganov, D. S.

AU - Slautina, A. S.

AU - Turygin, A. P.

AU - Shur, V. Ya.

N1 - The research was made possible by Russian Science Foundation (project no. 19-12-00210), https://rscf.ru/project/19-12-00210/. The equipment of the Ural Center for Shared Use “Modern nanotechnology” Ural Federal University (reg. no. 2968), which is supported by the Ministry of Science and Higher Education RF (project no. 075-15-2021-677) was used.

PY - 2023

Y1 - 2023

N2 - The ion beam-induced domain growth in Y-cut MgO-doped lithium niobate (MgOLN) covered by the resist layer was studied. A comparative study of domain structure in the samples with and without surface dielectric layer is crucial for periodical poling. Differences in the domain shape with changes in the irradiation dose, energy, and current of the ion beam were revealed. The maximum domain depth was 400 nm at 100 pC. A detailed analysis of interaction for different distance between irradiated dots in row revealed formation of 1 D arrays with variating length of the wedge-like domains. These findings allow optimizing the poling process. © 2023 Taylor & Francis Group, LLC.

AB - The ion beam-induced domain growth in Y-cut MgO-doped lithium niobate (MgOLN) covered by the resist layer was studied. A comparative study of domain structure in the samples with and without surface dielectric layer is crucial for periodical poling. Differences in the domain shape with changes in the irradiation dose, energy, and current of the ion beam were revealed. The maximum domain depth was 400 nm at 100 pC. A detailed analysis of interaction for different distance between irradiated dots in row revealed formation of 1 D arrays with variating length of the wedge-like domains. These findings allow optimizing the poling process. © 2023 Taylor & Francis Group, LLC.

UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=85150484875

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000946312900008

U2 - 10.1080/00150193.2023.2168980

DO - 10.1080/00150193.2023.2168980

M3 - Article

VL - 604

SP - 53

EP - 61

JO - Ferroelectrics

JF - Ferroelectrics

SN - 0015-0193

IS - 1

ER -

ID: 36199989