Field ion microscopy of radiation damage on an atomically clean surface of materials

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Ivchenko VA. Field ion microscopy of radiation damage on an atomically clean surface of materials. Journal of Physics: Conference Series. 2021 март 11;1799(1):012011. doi: 10.1088/1742-6596/1799/1/012011

@article{d2432b834b6e4b18b65bfeb24b1805fe,

title = "Field ion microscopy of radiation damage on an atomically clean surface of materials",

author = "Ivchenko, {V. A.}",

year = "2021",

month = mar,

day = "11",

doi = "10.1088/1742-6596/1799/1/012011",

language = "English",

volume = "1799",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "Institute of Physics Publishing",

number = "1",

note = "27th International Conference on Vacuum Technique and Technology, VTT 2020 ; Conference date: 27-10-2020 Through 29-10-2020",

}

TY - JOUR

T1 - Field ion microscopy of radiation damage on an atomically clean surface of materials

AU - Ivchenko, V. A.

PY - 2021/3/11

Y1 - 2021/3/11

UR - http://www.scopus.com/inward/record.url?scp=85103175561&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1799/1/012011

DO - 10.1088/1742-6596/1799/1/012011

M3 - Conference article

AN - SCOPUS:85103175561

VL - 1799

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012011

T2 - 27th International Conference on Vacuum Technique and Technology, VTT 2020

Y2 - 27 October 2020 through 29 October 2020

ER -

ID: 21179812