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Electrical studies of surface reconstruction resulting from chalcogen evaporation at the Ag2±δX/Vacuum interface (X=S, Se)X/Vacuum interface (X=S, Se). / Nadolsky, A. L.; Krzhivitskaya, J.; Matkina, Natalya N. и др.
в: Ionics, Том 6, № 3-4, 01.05.2000, стр. 235-238.

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@article{4c59faae707344a6b5f5e4a6f15b1f49,
title = "Electrical studies of surface reconstruction resulting from chalcogen evaporation at the Ag2±δX/Vacuum interface (X=S, Se)X/Vacuum interface (X=S, Se)",
abstract = "We have investigated the dissociation rates of nonstoichiometric semiconductors Ag2±δX (X=S, Se) to the vacuum by means of solid-state electrochemical technique. The values of chalcogen fluxes from the sample{\textquoteright}s surface were measured versus compound{\textquoteright}s composition and temperature. There has been obtained experimental evidence of the surface reconstruction of silver chalcogenides when the exact phase composition δcr.(T) is reached. This critical value δcr. correlates with the order-disorder transition in the silver sublattice for the Ag2±δX/vacuum interface.",
author = "Nadolsky, {A. L.} and J. Krzhivitskaya and Matkina, {Natalya N.} and Torgashova, {N. N.}",
year = "2000",
month = may,
day = "1",
doi = "10.1007/BF02374072",
language = "English",
volume = "6",
pages = "235--238",
journal = "Ionics",
issn = "0947-7047",
publisher = "Springer",
number = "3-4",

}

RIS

TY - JOUR

T1 - Electrical studies of surface reconstruction resulting from chalcogen evaporation at the Ag2±δX/Vacuum interface (X=S, Se)X/Vacuum interface (X=S, Se)

AU - Nadolsky, A. L.

AU - Krzhivitskaya, J.

AU - Matkina, Natalya N.

AU - Torgashova, N. N.

PY - 2000/5/1

Y1 - 2000/5/1

N2 - We have investigated the dissociation rates of nonstoichiometric semiconductors Ag2±δX (X=S, Se) to the vacuum by means of solid-state electrochemical technique. The values of chalcogen fluxes from the sample’s surface were measured versus compound’s composition and temperature. There has been obtained experimental evidence of the surface reconstruction of silver chalcogenides when the exact phase composition δcr.(T) is reached. This critical value δcr. correlates with the order-disorder transition in the silver sublattice for the Ag2±δX/vacuum interface.

AB - We have investigated the dissociation rates of nonstoichiometric semiconductors Ag2±δX (X=S, Se) to the vacuum by means of solid-state electrochemical technique. The values of chalcogen fluxes from the sample’s surface were measured versus compound’s composition and temperature. There has been obtained experimental evidence of the surface reconstruction of silver chalcogenides when the exact phase composition δcr.(T) is reached. This critical value δcr. correlates with the order-disorder transition in the silver sublattice for the Ag2±δX/vacuum interface.

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000208028500011

UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=77950437561

U2 - 10.1007/BF02374072

DO - 10.1007/BF02374072

M3 - Article

VL - 6

SP - 235

EP - 238

JO - Ionics

JF - Ionics

SN - 0947-7047

IS - 3-4

ER -

ID: 42981369