Результаты исследований: Вклад в журнал › Статья › Рецензирование
Результаты исследований: Вклад в журнал › Статья › Рецензирование
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TY - JOUR
T1 - Electrical studies of surface reconstruction resulting from chalcogen evaporation at the Ag2±δX/Vacuum interface (X=S, Se)X/Vacuum interface (X=S, Se)
AU - Nadolsky, A. L.
AU - Krzhivitskaya, J.
AU - Matkina, Natalya N.
AU - Torgashova, N. N.
PY - 2000/5/1
Y1 - 2000/5/1
N2 - We have investigated the dissociation rates of nonstoichiometric semiconductors Ag2±δX (X=S, Se) to the vacuum by means of solid-state electrochemical technique. The values of chalcogen fluxes from the sample’s surface were measured versus compound’s composition and temperature. There has been obtained experimental evidence of the surface reconstruction of silver chalcogenides when the exact phase composition δcr.(T) is reached. This critical value δcr. correlates with the order-disorder transition in the silver sublattice for the Ag2±δX/vacuum interface.
AB - We have investigated the dissociation rates of nonstoichiometric semiconductors Ag2±δX (X=S, Se) to the vacuum by means of solid-state electrochemical technique. The values of chalcogen fluxes from the sample’s surface were measured versus compound’s composition and temperature. There has been obtained experimental evidence of the surface reconstruction of silver chalcogenides when the exact phase composition δcr.(T) is reached. This critical value δcr. correlates with the order-disorder transition in the silver sublattice for the Ag2±δX/vacuum interface.
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000208028500011
UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=77950437561
U2 - 10.1007/BF02374072
DO - 10.1007/BF02374072
M3 - Article
VL - 6
SP - 235
EP - 238
JO - Ionics
JF - Ionics
SN - 0947-7047
IS - 3-4
ER -
ID: 42981369