Standard

Across-plane electrical conductivity of ytterbium-doped HfO2 film using impedance spectroscopy and DRT analysis. / Kolchugin, A. A.; Meshcherskikh, A. N.; Dunyushkina, L. A.
в: Electrochimica Acta, Том 356, 136834, 01.10.2020.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

Harvard

Kolchugin, AA, Meshcherskikh, AN & Dunyushkina, LA 2020, 'Across-plane electrical conductivity of ytterbium-doped HfO2 film using impedance spectroscopy and DRT analysis', Electrochimica Acta, Том. 356, 136834. https://doi.org/10.1016/j.electacta.2020.136834

APA

Kolchugin, A. A., Meshcherskikh, A. N., & Dunyushkina, L. A. (2020). Across-plane electrical conductivity of ytterbium-doped HfO2 film using impedance spectroscopy and DRT analysis. Electrochimica Acta, 356, [136834]. https://doi.org/10.1016/j.electacta.2020.136834

Vancouver

Kolchugin AA, Meshcherskikh AN, Dunyushkina LA. Across-plane electrical conductivity of ytterbium-doped HfO2 film using impedance spectroscopy and DRT analysis. Electrochimica Acta. 2020 окт. 1;356:136834. doi: 10.1016/j.electacta.2020.136834

Author

Kolchugin, A. A. ; Meshcherskikh, A. N. ; Dunyushkina, L. A. / Across-plane electrical conductivity of ytterbium-doped HfO2 film using impedance spectroscopy and DRT analysis. в: Electrochimica Acta. 2020 ; Том 356.

BibTeX

@article{1166cd26e6694086a846d6555fd1402c,
title = "Across-plane electrical conductivity of ytterbium-doped HfO2 film using impedance spectroscopy and DRT analysis",
keywords = "Bulk conductivity, Chemical solution deposition, Distribution of relaxation time, Electrolyte film, Grain boundary conductivity, Impedance spectroscopy, Yb-doped HfO, Yb-doped HfO2, THIN-FILMS, HAFNIUM OXIDE, ZIRCONIA, STABILITY, LUMINESCENCE, THERMAL BARRIER COATINGS, DIELECTRICS, MICROSTRUCTURE",
author = "Kolchugin, {A. A.} and Meshcherskikh, {A. N.} and Dunyushkina, {L. A.}",
year = "2020",
month = oct,
day = "1",
doi = "10.1016/j.electacta.2020.136834",
language = "English",
volume = "356",
journal = "Electrochimica Acta",
issn = "0013-4686",
publisher = "Pergamon Press",

}

RIS

TY - JOUR

T1 - Across-plane electrical conductivity of ytterbium-doped HfO2 film using impedance spectroscopy and DRT analysis

AU - Kolchugin, A. A.

AU - Meshcherskikh, A. N.

AU - Dunyushkina, L. A.

PY - 2020/10/1

Y1 - 2020/10/1

KW - Bulk conductivity

KW - Chemical solution deposition

KW - Distribution of relaxation time

KW - Electrolyte film

KW - Grain boundary conductivity

KW - Impedance spectroscopy

KW - Yb-doped HfO

KW - Yb-doped HfO2

KW - THIN-FILMS

KW - HAFNIUM OXIDE

KW - ZIRCONIA

KW - STABILITY

KW - LUMINESCENCE

KW - THERMAL BARRIER COATINGS

KW - DIELECTRICS

KW - MICROSTRUCTURE

UR - http://www.scopus.com/inward/record.url?scp=85088923884&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000571850900006

U2 - 10.1016/j.electacta.2020.136834

DO - 10.1016/j.electacta.2020.136834

M3 - Article

AN - SCOPUS:85088923884

VL - 356

JO - Electrochimica Acta

JF - Electrochimica Acta

SN - 0013-4686

M1 - 136834

ER -

ID: 13666377