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X-ray photoelectron spectroscopy study of Cr/[Pd/Gd/Pd/Fe] multilayered nanostructures. / Zhidkov, I. S.; Kukharenko, A. I.; Antropov, N. O. et al.
In: Thin Solid Films, Vol. 709, 138251, 01.09.2020.

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@article{eb4eed59d56b4012832ac164a6152b23,
title = "X-ray photoelectron spectroscopy study of Cr/[Pd/Gd/Pd/Fe] multilayered nanostructures",
keywords = "Oxidation, Surface, Thin metallic films, X-ray photoelectron spectroscopy, OXIDATION, XPS, MAGNETIC-PROPERTIES, BAND, LAYER, ELECTRONIC-STRUCTURE",
author = "Zhidkov, {I. S.} and Kukharenko, {A. I.} and Antropov, {N. O.} and Kravtsov, {E. A.} and Makarova, {M. V.} and Cholakh, {S. O.} and Kurmaev, {E. Z.}",
year = "2020",
month = sep,
day = "1",
doi = "10.1016/j.tsf.2020.138251",
language = "English",
volume = "709",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier BV",

}

RIS

TY - JOUR

T1 - X-ray photoelectron spectroscopy study of Cr/[Pd/Gd/Pd/Fe] multilayered nanostructures

AU - Zhidkov, I. S.

AU - Kukharenko, A. I.

AU - Antropov, N. O.

AU - Kravtsov, E. A.

AU - Makarova, M. V.

AU - Cholakh, S. O.

AU - Kurmaev, E. Z.

PY - 2020/9/1

Y1 - 2020/9/1

KW - Oxidation

KW - Surface

KW - Thin metallic films

KW - X-ray photoelectron spectroscopy

KW - OXIDATION

KW - XPS

KW - MAGNETIC-PROPERTIES

KW - BAND

KW - LAYER

KW - ELECTRONIC-STRUCTURE

UR - http://www.scopus.com/inward/record.url?scp=85088655403&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000561801500009

U2 - 10.1016/j.tsf.2020.138251

DO - 10.1016/j.tsf.2020.138251

M3 - Article

AN - SCOPUS:85088655403

VL - 709

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

M1 - 138251

ER -

ID: 13663369