Standard

Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope. / Kolosov, V. Yu; Yushkov, A. A.; Veretennikov, L. M.
In: Journal of Physics: Conference Series, Vol. 1115, No. 3, 032087, 27.11.2018.

Research output: Contribution to journal › Conference article › peer-review

Harvard

Kolosov, VY, Yushkov, AA & Veretennikov, LM 2018, 'Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope', Journal of Physics: Conference Series, vol. 1115, no. 3, 032087. https://doi.org/10.1088/1742-6596/1115/3/032087

APA

Kolosov, V. Y., Yushkov, A. A., & Veretennikov, L. M. (2018). Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope. Journal of Physics: Conference Series, 1115(3), [032087]. https://doi.org/10.1088/1742-6596/1115/3/032087

Vancouver

Kolosov VY, Yushkov AA, Veretennikov LM. Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope. Journal of Physics: Conference Series. 2018 Nov 27;1115(3):032087. doi: 10.1088/1742-6596/1115/3/032087

Author

Kolosov, V. Yu ; Yushkov, A. A. ; Veretennikov, L. M. / Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope. In: Journal of Physics: Conference Series. 2018 ; Vol. 1115, No. 3.

BibTeX

@article{2f8a2e6673ee49b8a49041db80348cd4,
title = "Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope",
author = "Kolosov, {V. Yu} and Yushkov, {A. A.} and Veretennikov, {L. M.}",
year = "2018",
month = nov,
day = "27",
doi = "10.1088/1742-6596/1115/3/032087",
language = "English",
volume = "1115",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "Institute of Physics Publishing",
number = "3",
note = "6th International Congress on Energy Fluxes and Radiation Effects 2018, EFRE 2018 ; Conference date: 16-09-2018 Through 22-09-2018",

}

RIS

TY - JOUR

T1 - Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope

AU - Kolosov, V. Yu

AU - Yushkov, A. A.

AU - Veretennikov, L. M.

PY - 2018/11/27

Y1 - 2018/11/27

UR - http://www.scopus.com/inward/record.url?scp=85058216525&partnerID=8YFLogxK

UR - https://elibrary.ru/item.asp?id=38679204

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000546577800129

U2 - 10.1088/1742-6596/1115/3/032087

DO - 10.1088/1742-6596/1115/3/032087

M3 - Conference article

AN - SCOPUS:85058216525

VL - 1115

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 3

M1 - 032087

T2 - 6th International Congress on Energy Fluxes and Radiation Effects 2018, EFRE 2018

Y2 - 16 September 2018 through 22 September 2018

ER -

ID: 8424422