Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2 › Research Explorer

DOI

https://doi.org/10.1016/j.apsusc.2016.04.045
Final published version

Original language	English
Pages (from-to)	223-229
Number of pages	7
Journal	Applied Surface Science
Volume	379
DOIs	https://doi.org/10.1016/j.apsusc.2016.04.045
Publication status	Published - 30 Aug 2016

Research areas

Aggregation, Bismuth oxide, DFT, Ion implantation, Titanium dioxide

WoS ResearchAreas Categories

Chemistry, Physical
Materials Science, Coatings & Films
Physics, Applied
Physics, Condensed Matter

ASJC Scopus subject areas

Surfaces, Coatings and Films

ID: 797211