Standard

Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films. / Rinkevich, Anatoly B.; Perov, Dmitry V.; Vaskovsky, Vladimir O. et al.
In: IEEE Transactions on Nanotechnology, Vol. 16, No. 6, 8023889, 11.2017, p. 1067-1072.

Research output: Contribution to journal › Article › peer-review

Harvard

Rinkevich, AB, Perov, DV, Vaskovsky, VO, Gorkovenko, AN & Kuznetsov, EA 2017, 'Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films', IEEE Transactions on Nanotechnology, vol. 16, no. 6, 8023889, pp. 1067-1072. https://doi.org/10.1109/TNANO.2017.2748344

APA

Rinkevich, A. B., Perov, D. V., Vaskovsky, V. O., Gorkovenko, A. N., & Kuznetsov, E. A. (2017). Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films. IEEE Transactions on Nanotechnology, 16(6), 1067-1072. [8023889]. https://doi.org/10.1109/TNANO.2017.2748344

Vancouver

Rinkevich AB, Perov DV, Vaskovsky VO, Gorkovenko AN, Kuznetsov EA. Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films. IEEE Transactions on Nanotechnology. 2017 Nov;16(6):1067-1072. 8023889. doi: 10.1109/TNANO.2017.2748344

Author

Rinkevich, Anatoly B. ; Perov, Dmitry V. ; Vaskovsky, Vladimir O. et al. / Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films. In: IEEE Transactions on Nanotechnology. 2017 ; Vol. 16, No. 6. pp. 1067-1072.

BibTeX

@article{f2e8a73c1eca4ad084c0029759a47bf0,
title = "Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films",
keywords = "Microwave measurement, microwave and dc conductivity, thin-film nanocomposite, waveguide, CO-SIO2 GRANULAR FILMS, MAGNETORESISTANCE, HETEROSTRUCTURE, TITANATES",
author = "Rinkevich, {Anatoly B.} and Perov, {Dmitry V.} and Vaskovsky, {Vladimir O.} and Gorkovenko, {Alexandr N.} and Kuznetsov, {Evgeny A.}",
year = "2017",
month = nov,
doi = "10.1109/TNANO.2017.2748344",
language = "English",
volume = "16",
pages = "1067--1072",
journal = "IEEE Transactions on Nanotechnology",
issn = "1536-125X",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",

}

RIS

TY - JOUR

T1 - Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films

AU - Rinkevich, Anatoly B.

AU - Perov, Dmitry V.

AU - Vaskovsky, Vladimir O.

AU - Gorkovenko, Alexandr N.

AU - Kuznetsov, Evgeny A.

PY - 2017/11

Y1 - 2017/11

KW - Microwave measurement

KW - microwave and dc conductivity

KW - thin-film nanocomposite

KW - waveguide

KW - CO-SIO2 GRANULAR FILMS

KW - MAGNETORESISTANCE

KW - HETEROSTRUCTURE

KW - TITANATES

UR - http://www.scopus.com/inward/record.url?scp=85029162630&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000415707200023

U2 - 10.1109/TNANO.2017.2748344

DO - 10.1109/TNANO.2017.2748344

M3 - Article

VL - 16

SP - 1067

EP - 1072

JO - IEEE Transactions on Nanotechnology

JF - IEEE Transactions on Nanotechnology

SN - 1536-125X

IS - 6

M1 - 8023889

ER -

ID: 6176775