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Microwave Resistance of Metal-Dielectric Film Nanocomposites Co-X(SiO2)(1-X). / Rinkevich, Anatoly B.; Perov, Dmitry V.; Vaskovsky, V. O. et al.
40TH EUROPEAN MICROWAVE CONFERENCE: book. NEW YORK: Institute of Electrical and Electronics Engineers Inc., 2010. p. 894-897 (European Microwave Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Harvard

Rinkevich, AB, Perov, DV, Vaskovsky, VO, Gorkovenko, AN & Kuznetsov, EA 2010, Microwave Resistance of Metal-Dielectric Film Nanocomposites Co-X(SiO2)(1-X). in 40TH EUROPEAN MICROWAVE CONFERENCE: book. European Microwave Conference, Institute of Electrical and Electronics Engineers Inc., NEW YORK, pp. 894-897.

APA

Rinkevich, A. B., Perov, D. V., Vaskovsky, V. O., Gorkovenko, A. N., & Kuznetsov, E. A. (2010). Microwave Resistance of Metal-Dielectric Film Nanocomposites Co-X(SiO2)(1-X). In 40TH EUROPEAN MICROWAVE CONFERENCE: book (pp. 894-897). (European Microwave Conference). Institute of Electrical and Electronics Engineers Inc..

Vancouver

Rinkevich AB, Perov DV, Vaskovsky VO, Gorkovenko AN, Kuznetsov EA. Microwave Resistance of Metal-Dielectric Film Nanocomposites Co-X(SiO2)(1-X). In 40TH EUROPEAN MICROWAVE CONFERENCE: book. NEW YORK: Institute of Electrical and Electronics Engineers Inc. 2010. p. 894-897. (European Microwave Conference).

Author

Rinkevich, Anatoly B. ; Perov, Dmitry V. ; Vaskovsky, V. O. et al. / Microwave Resistance of Metal-Dielectric Film Nanocomposites Co-X(SiO2)(1-X). 40TH EUROPEAN MICROWAVE CONFERENCE: book. NEW YORK : Institute of Electrical and Electronics Engineers Inc., 2010. pp. 894-897 (European Microwave Conference).

BibTeX

@inproceedings{ceb2092c69b547e2aec24b6530861625,
title = "Microwave Resistance of Metal-Dielectric Film Nanocomposites Co-X(SiO2)(1-X)",
abstract = "Penetration and reflection of millimeter waveband electromagnetic waves have been studied for thin film metaldielectric nanocomposite Co-x(Si0(2)) (1-x) materials, in which cobalt nanoparticles are placed inside of 100nm thickness SiO2 film. Microwave properties of nanocomposite samples with different cobalt content have been measured. Measurements are carried out in frequency range from 26 to 38 GHz. The frequency dependencies of transmission and reflection coefficients are obtained. Share of power loss in the samples was calculated. The algorithm for conductivity reconstruction from the transmission coefficient frequency dependence was worked out. It was found that the microwave conductivity arises with increase of cobalt content and differs essentially from dc conductivity.",
author = "Rinkevich, {Anatoly B.} and Perov, {Dmitry V.} and Vaskovsky, {V. O.} and Gorkovenko, {A. N.} and Kuznetsov, {E. A.}",
note = "The work was done within OFN RAS Program (project No 4), with partial support of grant NSH-3545.2010.2",
year = "2010",
language = "English",
isbn = "978-2-87487-015-6",
series = "European Microwave Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "894--897",
booktitle = "40TH EUROPEAN MICROWAVE CONFERENCE",
address = "United States",

}

RIS

TY - GEN

T1 - Microwave Resistance of Metal-Dielectric Film Nanocomposites Co-X(SiO2)(1-X)

AU - Rinkevich, Anatoly B.

AU - Perov, Dmitry V.

AU - Vaskovsky, V. O.

AU - Gorkovenko, A. N.

AU - Kuznetsov, E. A.

N1 - The work was done within OFN RAS Program (project No 4), with partial support of grant NSH-3545.2010.2

PY - 2010

Y1 - 2010

N2 - Penetration and reflection of millimeter waveband electromagnetic waves have been studied for thin film metaldielectric nanocomposite Co-x(Si0(2)) (1-x) materials, in which cobalt nanoparticles are placed inside of 100nm thickness SiO2 film. Microwave properties of nanocomposite samples with different cobalt content have been measured. Measurements are carried out in frequency range from 26 to 38 GHz. The frequency dependencies of transmission and reflection coefficients are obtained. Share of power loss in the samples was calculated. The algorithm for conductivity reconstruction from the transmission coefficient frequency dependence was worked out. It was found that the microwave conductivity arises with increase of cobalt content and differs essentially from dc conductivity.

AB - Penetration and reflection of millimeter waveband electromagnetic waves have been studied for thin film metaldielectric nanocomposite Co-x(Si0(2)) (1-x) materials, in which cobalt nanoparticles are placed inside of 100nm thickness SiO2 film. Microwave properties of nanocomposite samples with different cobalt content have been measured. Measurements are carried out in frequency range from 26 to 38 GHz. The frequency dependencies of transmission and reflection coefficients are obtained. Share of power loss in the samples was calculated. The algorithm for conductivity reconstruction from the transmission coefficient frequency dependence was worked out. It was found that the microwave conductivity arises with increase of cobalt content and differs essentially from dc conductivity.

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000411276200228

UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=78650055831

M3 - Conference contribution

SN - 978-2-87487-015-6

T3 - European Microwave Conference

SP - 894

EP - 897

BT - 40TH EUROPEAN MICROWAVE CONFERENCE

PB - Institute of Electrical and Electronics Engineers Inc.

CY - NEW YORK

ER -

ID: 37890582