Standard

Microstructure of periodic metallic magnetic multilayer systems. / Vasiliev, A. L.; Subbotin, I. A.; Kravtsov, E. A. et al.
In: Thin Solid Films, Vol. 632, 30.06.2017, p. 79-87.

Research output: Contribution to journal › Article › peer-review

Harvard

Vasiliev, AL, Subbotin, IA, Kravtsov, EA, Ustinov, VV, Chesnokov, YM, Prutskov, GV & Pashaev, EM 2017, 'Microstructure of periodic metallic magnetic multilayer systems', Thin Solid Films, vol. 632, pp. 79-87. https://doi.org/10.1016/j.tsf.2017.04.033

APA

Vasiliev, A. L., Subbotin, I. A., Kravtsov, E. A., Ustinov, V. V., Chesnokov, Y. M., Prutskov, G. V., & Pashaev, E. M. (2017). Microstructure of periodic metallic magnetic multilayer systems. Thin Solid Films, 632, 79-87. https://doi.org/10.1016/j.tsf.2017.04.033

Vancouver

Vasiliev AL, Subbotin IA, Kravtsov EA, Ustinov VV, Chesnokov YM, Prutskov GV et al. Microstructure of periodic metallic magnetic multilayer systems. Thin Solid Films. 2017 Jun 30;632:79-87. doi: 10.1016/j.tsf.2017.04.033

Author

Vasiliev, A. L. ; Subbotin, I. A. ; Kravtsov, E. A. et al. / Microstructure of periodic metallic magnetic multilayer systems. In: Thin Solid Films. 2017 ; Vol. 632. pp. 79-87.

BibTeX

@article{119207d8bb724dbd92baaf67f1246770,
title = "Microstructure of periodic metallic magnetic multilayer systems",
keywords = "Metallic magnetic multilayers, Microanalysis, Microstructure, Resonant X-ray reflectivity, Scanning transmission electron microscopy",
author = "Vasiliev, {A. L.} and Subbotin, {I. A.} and Kravtsov, {E. A.} and Ustinov, {V. V.} and Chesnokov, {Y. M.} and Prutskov, {G. V.} and Pashaev, {E. M.}",
year = "2017",
month = jun,
day = "30",
doi = "10.1016/j.tsf.2017.04.033",
language = "English",
volume = "632",
pages = "79--87",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier BV",

}

RIS

TY - JOUR

T1 - Microstructure of periodic metallic magnetic multilayer systems

AU - Vasiliev, A. L.

AU - Subbotin, I. A.

AU - Kravtsov, E. A.

AU - Ustinov, V. V.

AU - Chesnokov, Y. M.

AU - Prutskov, G. V.

AU - Pashaev, E. M.

PY - 2017/6/30

Y1 - 2017/6/30

KW - Metallic magnetic multilayers

KW - Microanalysis

KW - Microstructure

KW - Resonant X-ray reflectivity

KW - Scanning transmission electron microscopy

UR - http://www.scopus.com/inward/record.url?scp=85018455937&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000402714800012

U2 - 10.1016/j.tsf.2017.04.033

DO - 10.1016/j.tsf.2017.04.033

M3 - Article

AN - SCOPUS:85018455937

VL - 632

SP - 79

EP - 87

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -

ID: 1817821