Micromagnetic Analysis of Temperature Dependences of Hysteresis Properties of Polycrystalline Films with Exchange Bias

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Micromagnetic Analysis of Temperature Dependences of Hysteresis Properties of Polycrystalline Films with Exchange Bias. / Kulesh, N. A.; Moskalev, M. E.; Vas’kovskii, V. O. et al.
In: Physics of Metals and Metallography, Vol. 122, No. 9, 09.2021, p. 855-860.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{a532e3629250495d911ee99ea38cda9d,

title = "Micromagnetic Analysis of Temperature Dependences of Hysteresis Properties of Polycrystalline Films with Exchange Bias",

keywords = "exchange bias, hysteresis properties, micromagnetic modeling, temperature, MODEL",

author = "Kulesh, {N. A.} and Moskalev, {M. E.} and Vas{\textquoteright}kovskii, {V. O.} and Stepanova, {E. A.} and Lepalovskii, {V. N.}",

note = "Publisher Copyright: {\textcopyright} 2021, Pleiades Publishing, Ltd.",

year = "2021",

month = sep,

doi = "10.1134/S0031918X21090064",

language = "English",

volume = "122",

pages = "855--860",

journal = "Physics of Metals and Metallography",

issn = "0031-918X",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "9",

}

RIS

TY - JOUR

T1 - Micromagnetic Analysis of Temperature Dependences of Hysteresis Properties of Polycrystalline Films with Exchange Bias

AU - Kulesh, N. A.

AU - Moskalev, M. E.

AU - Vas’kovskii, V. O.

AU - Stepanova, E. A.

AU - Lepalovskii, V. N.

PY - 2021/9

Y1 - 2021/9

KW - exchange bias

KW - hysteresis properties

KW - micromagnetic modeling

KW - temperature

KW - MODEL

UR - http://www.scopus.com/inward/record.url?scp=85115828400&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000701060900005

U2 - 10.1134/S0031918X21090064

DO - 10.1134/S0031918X21090064

M3 - Article

AN - SCOPUS:85115828400

VL - 122

SP - 855

EP - 860

JO - Physics of Metals and Metallography

JF - Physics of Metals and Metallography

SN - 0031-918X

IS - 9

ER -

ID: 23725844