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Magnetoimpedance of FeNi thin film meanders. / Volchkov, S. O.; Yuvchenko, A. A.; Lepalovskij, V. N. et al.
Magnetism and Magnetic Materials V. Vol. 190 Trans Tech Publications Ltd., 2012. p. 609-612 (Solid State Phenomena; Vol. 190).

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Harvard

Volchkov, SO, Yuvchenko, AA, Lepalovskij, VN, Fernandez, E & Kurlyandskaya, GV 2012, Magnetoimpedance of FeNi thin film meanders. in Magnetism and Magnetic Materials V. vol. 190, Solid State Phenomena, vol. 190, Trans Tech Publications Ltd., pp. 609-612, 5th Moscow International Symposium on Magnetism (MISM 2011), Moscow, Russian Federation, 21/08/2011. https://doi.org/10.4028/www.scientific.net/SSP.190.609

APA

Volchkov, S. O., Yuvchenko, A. A., Lepalovskij, V. N., Fernandez, E., & Kurlyandskaya, G. V. (2012). Magnetoimpedance of FeNi thin film meanders. In Magnetism and Magnetic Materials V (Vol. 190, pp. 609-612). (Solid State Phenomena; Vol. 190). Trans Tech Publications Ltd.. https://doi.org/10.4028/www.scientific.net/SSP.190.609

Vancouver

Volchkov SO, Yuvchenko AA, Lepalovskij VN, Fernandez E, Kurlyandskaya GV. Magnetoimpedance of FeNi thin film meanders. In Magnetism and Magnetic Materials V. Vol. 190. Trans Tech Publications Ltd. 2012. p. 609-612. (Solid State Phenomena). doi: 10.4028/www.scientific.net/SSP.190.609

Author

Volchkov, S. O. ; Yuvchenko, A. A. ; Lepalovskij, V. N. et al. / Magnetoimpedance of FeNi thin film meanders. Magnetism and Magnetic Materials V. Vol. 190 Trans Tech Publications Ltd., 2012. pp. 609-612 (Solid State Phenomena).

BibTeX

@inproceedings{7c44c61527144db4932a694fba91aaa0,
title = "Magnetoimpedance of FeNi thin film meanders",
keywords = "Lithography, Magnetic field sensor, Magnetoimpedance, Meander structure, Nife films",
author = "Volchkov, {S. O.} and Yuvchenko, {A. A.} and Lepalovskij, {V. N.} and E. Fernandez and Kurlyandskaya, {G. V.}",
year = "2012",
doi = "10.4028/www.scientific.net/SSP.190.609",
language = "English",
isbn = "9783037854365",
volume = "190",
series = "Solid State Phenomena",
publisher = "Trans Tech Publications Ltd.",
pages = "609--612",
booktitle = "Magnetism and Magnetic Materials V",
address = "Switzerland",
note = "5th Moscow International Symposium on Magnetism (MISM 2011) ; Conference date: 21-08-2011 Through 25-08-2011",

}

RIS

TY - GEN

T1 - Magnetoimpedance of FeNi thin film meanders

AU - Volchkov, S. O.

AU - Yuvchenko, A. A.

AU - Lepalovskij, V. N.

AU - Fernandez, E.

AU - Kurlyandskaya, G. V.

PY - 2012

Y1 - 2012

KW - Lithography

KW - Magnetic field sensor

KW - Magnetoimpedance

KW - Meander structure

KW - Nife films

UR - http://www.scopus.com/inward/record.url?scp=84864226373&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000308061600146

U2 - 10.4028/www.scientific.net/SSP.190.609

DO - 10.4028/www.scientific.net/SSP.190.609

M3 - Conference contribution

AN - SCOPUS:84864226373

SN - 9783037854365

VL - 190

T3 - Solid State Phenomena

SP - 609

EP - 612

BT - Magnetism and Magnetic Materials V

PB - Trans Tech Publications Ltd.

T2 - 5th Moscow International Symposium on Magnetism (MISM 2011)

Y2 - 21 August 2011 through 25 August 2011

ER -

ID: 1127499