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Latent tracks of swift Bi ions in Si3N4. / Van Vuuren, A. Janse; Ibrayeva, A.; Rymzhanov, R. A. et al.
In:
Materials Research Express, Vol. 7, No. 2, 025512, 02.2020.
Research output: Contribution to journal › Article › peer-review
Harvard
Van Vuuren, AJ, Ibrayeva, A, Rymzhanov, RA, Zhalmagambetova, A, O'Connell, JH, Skuratov, VA, Uglov, VV, Zlotski, SV
, Volkov, AE & Zdorovets, M 2020, '
Latent tracks of swift Bi ions in Si3N4',
Materials Research Express, vol. 7, no. 2, 025512.
https://doi.org/10.1088/2053-1591/ab72d3APA
Van Vuuren, A. J., Ibrayeva, A., Rymzhanov, R. A., Zhalmagambetova, A., O'Connell, J. H., Skuratov, V. A., Uglov, V. V., Zlotski, S. V.
, Volkov, A. E., & Zdorovets, M. (2020).
Latent tracks of swift Bi ions in Si3N4.
Materials Research Express,
7(2), [025512].
https://doi.org/10.1088/2053-1591/ab72d3Vancouver
Van Vuuren AJ, Ibrayeva A, Rymzhanov RA, Zhalmagambetova A, O'Connell JH, Skuratov VA et al.
Latent tracks of swift Bi ions in Si3N4.
Materials Research Express. 2020 Feb;7(2):025512. doi: 10.1088/2053-1591/ab72d3
Author
BibTeX
@article{c7e7e0155a444cc3b16401a629bb3f3b,
title = "Latent tracks of swift Bi ions in Si3N4",
keywords = "Electron microscopy, Latent tracks, Molecular dynamics simulation, Swift heavy ions, X-ray diffraction, molecular dynamics simulation, MODEL, swift heavy ions, DAMAGE, IRRADIATION, SILICON-NITRIDE, latent tracks, x-ray diffraction, electron microscopy",
author = "{Van Vuuren}, {A. Janse} and A. Ibrayeva and Rymzhanov, {R. A.} and A. Zhalmagambetova and O'Connell, {J. H.} and Skuratov, {V. A.} and Uglov, {V. V.} and Zlotski, {S. V.} and Volkov, {A. E.} and M. Zdorovets",
year = "2020",
month = feb,
doi = "10.1088/2053-1591/ab72d3",
language = "English",
volume = "7",
journal = "Materials Research Express",
issn = "2053-1591",
publisher = "Institute of Physics Publishing (IOP)",
number = "2",
}
RIS
TY - JOUR
T1 - Latent tracks of swift Bi ions in Si3N4
AU - Van Vuuren, A. Janse
AU - Ibrayeva, A.
AU - Rymzhanov, R. A.
AU - Zhalmagambetova, A.
AU - O'Connell, J. H.
AU - Skuratov, V. A.
AU - Uglov, V. V.
AU - Zlotski, S. V.
AU - Volkov, A. E.
AU - Zdorovets, M.
PY - 2020/2
Y1 - 2020/2
KW - Electron microscopy
KW - Latent tracks
KW - Molecular dynamics simulation
KW - Swift heavy ions
KW - X-ray diffraction
KW - molecular dynamics simulation
KW - MODEL
KW - swift heavy ions
KW - DAMAGE
KW - IRRADIATION
KW - SILICON-NITRIDE
KW - latent tracks
KW - x-ray diffraction
KW - electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85081948267&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000535216800001
U2 - 10.1088/2053-1591/ab72d3
DO - 10.1088/2053-1591/ab72d3
M3 - Article
AN - SCOPUS:85081948267
VL - 7
JO - Materials Research Express
JF - Materials Research Express
SN - 2053-1591
IS - 2
M1 - 025512
ER -
