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Investigation of the Characteristics of the TEM Cell Prototype. /
Chechetkin, Victor; Korotkov, Alexey; Kozlov, Vladimir.
SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. p. 241-244 8958168 (SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Harvard
Chechetkin, V, Korotkov, A & Kozlov, V 2019,
Investigation of the Characteristics of the TEM Cell Prototype. in
SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings., 8958168, SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 241-244, 2019 International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2019, Novosibirsk, Russian Federation,
21/10/2019.
https://doi.org/10.1109/SIBIRCON48586.2019.8958168
APA
Vancouver
Chechetkin V, Korotkov A, Kozlov V.
Investigation of the Characteristics of the TEM Cell Prototype. In SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. p. 241-244. 8958168. (SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings). doi: 10.1109/SIBIRCON48586.2019.8958168
Author
BibTeX
@inproceedings{a3184e33d2d74bbfb70adf0517ce907d,
title = "Investigation of the Characteristics of the TEM Cell Prototype",
keywords = "electric field strength, open TEM cell, TEM cell",
author = "Victor Chechetkin and Alexey Korotkov and Vladimir Kozlov",
year = "2019",
month = oct,
doi = "10.1109/SIBIRCON48586.2019.8958168",
language = "English",
series = "SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "241--244",
booktitle = "SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings",
address = "United States",
note = "2019 International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2019 ; Conference date: 21-10-2019 Through 27-10-2019",
}
RIS
TY - GEN
T1 - Investigation of the Characteristics of the TEM Cell Prototype
AU - Chechetkin, Victor
AU - Korotkov, Alexey
AU - Kozlov, Vladimir
PY - 2019/10
Y1 - 2019/10
KW - electric field strength
KW - open TEM cell
KW - TEM cell
UR - http://www.scopus.com/inward/record.url?scp=85079073895&partnerID=8YFLogxK
U2 - 10.1109/SIBIRCON48586.2019.8958168
DO - 10.1109/SIBIRCON48586.2019.8958168
M3 - Conference contribution
AN - SCOPUS:85079073895
T3 - SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings
SP - 241
EP - 244
BT - SIBIRCON 2019 - International Multi-Conference on Engineering, Computer and Information Sciences, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2019
Y2 - 21 October 2019 through 27 October 2019
ER -
