Standard

Impact of technical losses calculation method on bad data validation on the basis of a posteriori analysis. / Kochneva, Elena; Sukalo, Aleksandar.
2016 IEEE International Energy Conference, ENERGYCON 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7513899.

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Harvard

Kochneva, E & Sukalo, A 2016, Impact of technical losses calculation method on bad data validation on the basis of a posteriori analysis. in 2016 IEEE International Energy Conference, ENERGYCON 2016., 7513899, Institute of Electrical and Electronics Engineers Inc., 2016 IEEE International Energy Conference, ENERGYCON 2016, Leuven, Belgium, 04/04/2016. https://doi.org/10.1109/ENERGYCON.2016.7513899

APA

Kochneva, E., & Sukalo, A. (2016). Impact of technical losses calculation method on bad data validation on the basis of a posteriori analysis. In 2016 IEEE International Energy Conference, ENERGYCON 2016 [7513899] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ENERGYCON.2016.7513899

Vancouver

Kochneva E, Sukalo A. Impact of technical losses calculation method on bad data validation on the basis of a posteriori analysis. In 2016 IEEE International Energy Conference, ENERGYCON 2016. Institute of Electrical and Electronics Engineers Inc. 2016. 7513899 doi: 10.1109/ENERGYCON.2016.7513899

Author

Kochneva, Elena ; Sukalo, Aleksandar. / Impact of technical losses calculation method on bad data validation on the basis of a posteriori analysis. 2016 IEEE International Energy Conference, ENERGYCON 2016. Institute of Electrical and Electronics Engineers Inc., 2016.

BibTeX

@inproceedings{a547f719680d4cb9b4659fad44a9340a,
title = "Impact of technical losses calculation method on bad data validation on the basis of a posteriori analysis",
keywords = "Bad data detection, Evaluation residues, State estimation, Technical energy losses",
author = "Elena Kochneva and Aleksandar Sukalo",
year = "2016",
month = jul,
day = "14",
doi = "10.1109/ENERGYCON.2016.7513899",
language = "English",
booktitle = "2016 IEEE International Energy Conference, ENERGYCON 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "2016 IEEE International Energy Conference, ENERGYCON 2016 ; Conference date: 04-04-2016 Through 08-04-2016",

}

RIS

TY - GEN

T1 - Impact of technical losses calculation method on bad data validation on the basis of a posteriori analysis

AU - Kochneva, Elena

AU - Sukalo, Aleksandar

PY - 2016/7/14

Y1 - 2016/7/14

KW - Bad data detection

KW - Evaluation residues

KW - State estimation

KW - Technical energy losses

UR - http://www.scopus.com/inward/record.url?scp=84982830379&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000390822900029

U2 - 10.1109/ENERGYCON.2016.7513899

DO - 10.1109/ENERGYCON.2016.7513899

M3 - Conference contribution

AN - SCOPUS:84982830379

BT - 2016 IEEE International Energy Conference, ENERGYCON 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2016 IEEE International Energy Conference, ENERGYCON 2016

Y2 - 4 April 2016 through 8 April 2016

ER -

ID: 1056053