Standard

Crystal lattice orientation analysis of PZT thin film with 10 % la content by transmission electron microscopy. / Kolosov, V. Yu; Zhigalina, O. M.; Khmelenin, D. N. et al.
Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. ed. / VA Volkovich; SV Zvonarev; Kashin; ED Narkhov. Vol. 2015 American Institute of Physics Inc., 2018. 020043 (AIP Conference Proceedings; Vol. 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Harvard

Kolosov, VY, Zhigalina, OM, Khmelenin, DN & Bokuniaeva, AO 2018, Crystal lattice orientation analysis of PZT thin film with 10 % la content by transmission electron microscopy. in VA Volkovich, SV Zvonarev, Kashin & ED Narkhov (eds), Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. vol. 2015, 020043, AIP Conference Proceedings, vol. 2015, American Institute of Physics Inc., 5th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2018, Ekaterinburg, Russian Federation, 13/05/2018. https://doi.org/10.1063/1.5055116

APA

Kolosov, V. Y., Zhigalina, O. M., Khmelenin, D. N., & Bokuniaeva, A. O. (2018). Crystal lattice orientation analysis of PZT thin film with 10 % la content by transmission electron microscopy. In VA. Volkovich, SV. Zvonarev, Kashin, & ED. Narkhov (Eds.), Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference (Vol. 2015). [020043] (AIP Conference Proceedings; Vol. 2015). American Institute of Physics Inc.. https://doi.org/10.1063/1.5055116

Vancouver

Kolosov VY, Zhigalina OM, Khmelenin DN, Bokuniaeva AO. Crystal lattice orientation analysis of PZT thin film with 10 % la content by transmission electron microscopy. In Volkovich VA, Zvonarev SV, Kashin, Narkhov ED, editors, Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. Vol. 2015. American Institute of Physics Inc. 2018. 020043. (AIP Conference Proceedings). doi: 10.1063/1.5055116

Author

Kolosov, V. Yu ; Zhigalina, O. M. ; Khmelenin, D. N. et al. / Crystal lattice orientation analysis of PZT thin film with 10 % la content by transmission electron microscopy. Physics, Technologies and Innovation, PTI 2018: Proceedings of the V International Young Researchers' Conference. editor / VA Volkovich ; SV Zvonarev ; Kashin ; ED Narkhov. Vol. 2015 American Institute of Physics Inc., 2018. (AIP Conference Proceedings).

BibTeX

@inproceedings{891563cc073d4e069cea1d460abab04c,
title = "Crystal lattice orientation analysis of PZT thin film with 10 % la content by transmission electron microscopy",
author = "Kolosov, {V. Yu} and Zhigalina, {O. M.} and Khmelenin, {D. N.} and Bokuniaeva, {A. O.}",
year = "2018",
month = sep,
day = "25",
doi = "10.1063/1.5055116",
language = "English",
isbn = "9780735417335",
volume = "2015",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "VA Volkovich and SV Zvonarev and Kashin and ED Narkhov",
booktitle = "Physics, Technologies and Innovation, PTI 2018",
address = "United States",
note = "5th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2018 ; Conference date: 13-05-2018 Through 17-05-2018",

}

RIS

TY - GEN

T1 - Crystal lattice orientation analysis of PZT thin film with 10 % la content by transmission electron microscopy

AU - Kolosov, V. Yu

AU - Zhigalina, O. M.

AU - Khmelenin, D. N.

AU - Bokuniaeva, A. O.

PY - 2018/9/25

Y1 - 2018/9/25

UR - http://www.scopus.com/inward/record.url?scp=85054197961&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000481575200043

UR - https://elibrary.ru/item.asp?id=38645276

U2 - 10.1063/1.5055116

DO - 10.1063/1.5055116

M3 - Conference contribution

AN - SCOPUS:85054197961

SN - 9780735417335

VL - 2015

T3 - AIP Conference Proceedings

BT - Physics, Technologies and Innovation, PTI 2018

A2 - Volkovich, VA

A2 - Zvonarev, SV

A2 - Kashin, null

A2 - Narkhov, ED

PB - American Institute of Physics Inc.

T2 - 5th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2018

Y2 - 13 May 2018 through 17 May 2018

ER -

ID: 7892169