Standard

Comparing three methods for solving probabilistic multi-area load shedding distribution. / Menaem, Amir Abdel; Oboskalov, Vladislav.
Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9111926 (Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020).

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Harvard

Menaem, AA & Oboskalov, V 2020, Comparing three methods for solving probabilistic multi-area load shedding distribution. in Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020., 9111926, Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020, Institute of Electrical and Electronics Engineers Inc., 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020, Sochi, Russian Federation, 18/05/2020. https://doi.org/10.1109/ICIEAM48468.2020.9111926

APA

Menaem, A. A., & Oboskalov, V. (2020). Comparing three methods for solving probabilistic multi-area load shedding distribution. In Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020 [9111926] (Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICIEAM48468.2020.9111926

Vancouver

Menaem AA, Oboskalov V. Comparing three methods for solving probabilistic multi-area load shedding distribution. In Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020. Institute of Electrical and Electronics Engineers Inc. 2020. 9111926. (Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020). doi: 10.1109/ICIEAM48468.2020.9111926

Author

Menaem, Amir Abdel ; Oboskalov, Vladislav. / Comparing three methods for solving probabilistic multi-area load shedding distribution. Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020. Institute of Electrical and Electronics Engineers Inc., 2020. (Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020).

BibTeX

@inproceedings{94f05788f23b45c18bb32f866460ccc9,
title = "Comparing three methods for solving probabilistic multi-area load shedding distribution",
keywords = "Latin hypercube sampling, Multi-Area Power Grids, Point estimate method, Probabilistic load shedding distribution, Quasi Monte Carlo simulation",
author = "Menaem, {Amir Abdel} and Vladislav Oboskalov",
year = "2020",
month = may,
doi = "10.1109/ICIEAM48468.2020.9111926",
language = "English",
series = "Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020",
address = "United States",
note = "2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020 ; Conference date: 18-05-2020 Through 22-05-2020",

}

RIS

TY - GEN

T1 - Comparing three methods for solving probabilistic multi-area load shedding distribution

AU - Menaem, Amir Abdel

AU - Oboskalov, Vladislav

PY - 2020/5

Y1 - 2020/5

KW - Latin hypercube sampling

KW - Multi-Area Power Grids

KW - Point estimate method

KW - Probabilistic load shedding distribution

KW - Quasi Monte Carlo simulation

UR - http://www.scopus.com/inward/record.url?scp=85086766225&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000607234900057

U2 - 10.1109/ICIEAM48468.2020.9111926

DO - 10.1109/ICIEAM48468.2020.9111926

M3 - Conference contribution

AN - SCOPUS:85086766225

T3 - Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020

BT - Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020

Y2 - 18 May 2020 through 22 May 2020

ER -

ID: 13144091