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Analysis of the composition of incident hydrogen ion beams accelerated by a Van de Graaff electrostatic accelerator. / Bazhukov, S. I.; Kibardin, A. V.; Pyatkova, T. M.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 58, No. 2, 01.06.1991, p. 242-246.

Research output: Contribution to journal › Article › peer-review

Harvard

Bazhukov, SI, Kibardin, AV & Pyatkova, TM 1991, 'Analysis of the composition of incident hydrogen ion beams accelerated by a Van de Graaff electrostatic accelerator', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 58, no. 2, pp. 242-246. https://doi.org/10.1016/0168-583X(91)95595-5

APA

Bazhukov, S. I., Kibardin, A. V., & Pyatkova, T. M. (1991). Analysis of the composition of incident hydrogen ion beams accelerated by a Van de Graaff electrostatic accelerator. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 58(2), 242-246. https://doi.org/10.1016/0168-583X(91)95595-5

Vancouver

Bazhukov SI, Kibardin AV, Pyatkova TM. Analysis of the composition of incident hydrogen ion beams accelerated by a Van de Graaff electrostatic accelerator. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 1991 Jun 1;58(2):242-246. doi: 10.1016/0168-583X(91)95595-5

Author

Bazhukov, S. I. ; Kibardin, A. V. ; Pyatkova, T. M. / Analysis of the composition of incident hydrogen ion beams accelerated by a Van de Graaff electrostatic accelerator. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 1991 ; Vol. 58, No. 2. pp. 242-246.

BibTeX

@article{c10ce3f06c474257ae819df979ceddd5,
title = "Analysis of the composition of incident hydrogen ion beams accelerated by a Van de Graaff electrostatic accelerator",
abstract = "A new technique is proposed for analysis of the composition of incident hydrogen ion beams accelerated by Van de Graaff electrostatic accelerators. The procedure is based on the analysis of the energy distribution of the neutral fraction of the hydrogen ion beam by a silicon surface barrier detector. It is shown that along with the main beam components (H+, H0) at the energy E0, another component exists at the energy 0.25 E0. This component is brought about through acceleration and breakup of molecular H2+ ions. However such inhomogeneities do not play a noticeable role in formation of the low energy tail of hydrogen ions backscattered from thin self-supporting films.",
author = "Bazhukov, {S. I.} and Kibardin, {A. V.} and Pyatkova, {T. M.}",
year = "1991",
month = jun,
day = "1",
doi = "10.1016/0168-583X(91)95595-5",
language = "English",
volume = "58",
pages = "242--246",
journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",
issn = "0168-583X",
publisher = "Elsevier BV",
number = "2",

}

RIS

TY - JOUR

T1 - Analysis of the composition of incident hydrogen ion beams accelerated by a Van de Graaff electrostatic accelerator

AU - Bazhukov, S. I.

AU - Kibardin, A. V.

AU - Pyatkova, T. M.

PY - 1991/6/1

Y1 - 1991/6/1

N2 - A new technique is proposed for analysis of the composition of incident hydrogen ion beams accelerated by Van de Graaff electrostatic accelerators. The procedure is based on the analysis of the energy distribution of the neutral fraction of the hydrogen ion beam by a silicon surface barrier detector. It is shown that along with the main beam components (H+, H0) at the energy E0, another component exists at the energy 0.25 E0. This component is brought about through acceleration and breakup of molecular H2+ ions. However such inhomogeneities do not play a noticeable role in formation of the low energy tail of hydrogen ions backscattered from thin self-supporting films.

AB - A new technique is proposed for analysis of the composition of incident hydrogen ion beams accelerated by Van de Graaff electrostatic accelerators. The procedure is based on the analysis of the energy distribution of the neutral fraction of the hydrogen ion beam by a silicon surface barrier detector. It is shown that along with the main beam components (H+, H0) at the energy E0, another component exists at the energy 0.25 E0. This component is brought about through acceleration and breakup of molecular H2+ ions. However such inhomogeneities do not play a noticeable role in formation of the low energy tail of hydrogen ions backscattered from thin self-supporting films.

UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=4344701648

U2 - 10.1016/0168-583X(91)95595-5

DO - 10.1016/0168-583X(91)95595-5

M3 - Article

VL - 58

SP - 242

EP - 246

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

SN - 0168-583X

IS - 2

ER -

ID: 55802981