1. 2022
  2. 2018
  3. Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope

    Kolosov, V. Y., Yushkov, A. A. & Veretennikov, L. M., 27 Nov 2018, In: Journal of Physics: Conference Series. 1115, 3, 032087.

    Research output: Contribution to journalConference articlepeer-review

ID: 53544